Optics Rotation Fall 2004 - background analysis - Matthias Riedmann


background analysis in θ-2θ geometry using soft x-rays

The task of this project was to measure the background in a θ-2θ reflection experiment with soft x-rays. The main source of background in this experiment is due to the monochromater, which delivers not only photons of the desired energy.

In the first part, the principle of the beamline and the θ-2θ scans is explained. After that, I present the calculations how to measure the background radiation. In the last section, the results are presented and discussed.


Aknowledgements

Thanks to Peter Abbamonte for giving me the chance to work on a synchrotron an offering this very interesting project. Also thanks to Andrivo Rusydi for the explanations and the introduction into the basics of the beamline.